Ⅰ Basics
1 The Transmission Electron Microscope
2 Scattering and Diffraction
3 Elastic Scattering
4 Inelastic Scattering and Beam Damage
5 Electron Sources
6 Lenses,Apertures,and Resolution
7 How to“See”Electrons
8 Pumps and Holders
9 The Instrument
10 Specimen Preparation
Ⅱ Diffraction
11 Diffraction Patterns
12 Thinking in Reciprocal Space
13 Diffracted Beams
14 Bloch Waves
15 Dispersion Surfaces
16 Diffraction from Crystals
17 Diffraction from Small Volumes
18 Indexing Diffraction Patterns
19 Kikuchi Diffraction
20 Obtaining CBED Patterns
21 Using Convergent-Beam Techniques
Ⅲ Imaging
22 Imaging in the TEM
23 Thickness and Bending Effects
24 Planar Defects
25 Strain Fields
26 Weak-Beam Dark-Field Microscopy
27 Phase-Contrast Images
28 High-Resolution TEM
29 Image Simulation
30 Quantifying and Processing HRTEM Images
31 Other Imaging Techniques
Ⅳ Spectrometry
32 X-ray Spectrometry
33 The XEDS-TEM Iterface
34 Qualitative X-ray Analysis
35 Qualitative X-ray Microanalysis
36 Spatial Resolution and Minimum Detectability
37 Electron Energy-Loss Spectrometers
38 The Energy-Loss Spectrum
39 Microanalysis with lonization-Loss Electrons
40 Everything Else in the Spectrum
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